发明名称 PREAMPLIFIER FOR SEMICONDUCTOR RADIATION MEASURING INSTRUMENT
摘要 PURPOSE:To reduce source noise so as to enhance the detecting ability of a semiconductor radiation detecting element by forming a trapping circuit and an overcurrent protection resistance between a power source for feeding power to a semiconductor detector and a common electrode formed in the semiconductor detector, and providing a detector circuit and an LPF(low-pass filter) at the rear stage of an inversion amplifier. CONSTITUTION:Of the noise of a semiconductor detector power source HV connected to a common electrode 3 formed in a semiconductor detector 1, since input impedance becomes zero at a series resonance frequency because of a trapping circuit 8 comprising L1 and C2, and no output signal is transmitted, noise components mixed in the power source are reduced. A protective resistance 9 is provided to enable the leak current and characteristic deterioration, etc., of the semiconductor detector 1 due to the influence of overcurrent to be prevented. A signal output from the detector is half-wave rectified using a detector circuit 10 formed at the rear stage of an inversion amplifier 4 and is forced to pass through an LPF 11, thereby only the actual radiation pulse from which noise components are removed can be detected.
申请公布号 JPH06138241(A) 申请公布日期 1994.05.20
申请号 JP19920285745 申请日期 1992.10.23
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 SUNAKAWA YOSHITAKA;NODA SAKAE
分类号 G01T1/17;G01T1/24;H01L31/09;H03F1/08;(IPC1-7):G01T1/24 主分类号 G01T1/17
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