发明名称 SoI-Halbleiteranordnung und Verfahren zu ihrer Herstellung.
摘要 <p>The present semiconductor device comprises a first semiconductor substrate, an oxide film formed on the substrate and a second semiconductor substrate bonded to the oxide film. In particular, the semiconductor substrate further has a monocrystalline silicon layer which is formed by an epitaxial growth method on the second semiconductor substrate. Circuit elements are formed within the monocrystalline silicon layer.</p>
申请公布号 DE3587798(D1) 申请公布日期 1994.05.19
申请号 DE19853587798 申请日期 1985.09.18
申请人 KABUSHIKI KAISHA TOSHIBA, KAWASAKI, KANAGAWA 发明人 NAKAGAWA, KAORU C/O PATENT DIVISION, MINATO-KU TOKYO 105;YAMAMOTO, YOSHIO C/O PATENT DIVISION, MINATO-KU TOKYO 105;MATSUOKA, NOBUTAKA C/O PATENT DIVISION, MINATO-KU TOKYO 105
分类号 H01L21/02;H01L21/20;H01L21/58;H01L21/762;H01L27/12;(IPC1-7):H01L27/12 主分类号 H01L21/02
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