发明名称 |
Flash EEPROM fabrication process that uses a selective wet chemical etch |
摘要 |
A method for wet etching disposable spacers in silicon integrated circuits is provided. Illustratively, a pair of spacers is formed over a polysilicon substrate. A second pair of spacers is formed from doped silicon dioxide over the first pair of spacers. Then the second pair of spacers is etched away with NH4OH/H2O2, thus providing a means for defining the underlying polysilicon layer, e.g., by etching.
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申请公布号 |
US5312781(A) |
申请公布日期 |
1994.05.17 |
申请号 |
US19910792496 |
申请日期 |
1991.11.12 |
申请人 |
AT&T BELL LABORATORIES |
发明人 |
GREGOR, RICHARD W.;LEUNG, CHUNG W. |
分类号 |
H01L21/311;(IPC1-7):H01L21/00;H01L21/02;H01L21/302;H01L21/463 |
主分类号 |
H01L21/311 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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