发明名称 FINE ROTATION GONIOMETER FOR X-RAY DIFFRACTION DEVICE
摘要 PURPOSE:To enable fine angle control for relatively wide angle measuring range. CONSTITUTION:To the rotation shaft 24 of a goniometer, an arm 26 is fixed and at the tip of the arm 26, a smooth surface 28 consisting of an involute curve is formed. The tip of a spindle 32 of a micrometer 30 is as sharp as a needle, which pushes the smooth surface 28. When the micrometer 30 is rotated, the spindle 32 moves up and down and the arm 26 rotates for a small angle theta. As the smooth surface 28 is formed with an involute curve, the moving distance (x) of the spindle 32 is completely proportional to the rotation angle theta. Therefore, compared with the conventional tangent bar method and the sine bar method micro rotation goniometer, angle measurement error accompanied by the arm rotation does not exist and thus, angle control without error for relatively wide angle measuring control becomes possible.
申请公布号 JPH06130194(A) 申请公布日期 1994.05.13
申请号 JP19920305851 申请日期 1992.10.21
申请人 RIGAKU CORP 发明人 KIKUCHI TETSUO
分类号 G01N23/20;G21K1/06 主分类号 G01N23/20
代理机构 代理人
主权项
地址