发明名称 Semiconductor devices
摘要 An ohmic contact structure for connection of a metal electrode to a highly integrated semiconductor device and a method for making the same. A contact hole is selectively formed in an insulating layer. A contact structure of a hetero-junction of Ge and Si1-xGex whose bandgap is lower than that of the underlying substrate material is formed between the interface of the metal electrode and the semiconductor substrate. The hetero-junction structure minimizes stress and strain between the metal electrode and the semiconductor substrate. The ohmic contact structure lowers the resistance of electronic lines and increases the reliability of integrated semiconductor devices.
申请公布号 GB9403816(D0) 申请公布日期 1994.04.20
申请号 GB19940003816 申请日期 1994.02.28
申请人 SAMSUNG ELECTRONICS CO LTD 发明人
分类号 H01L21/28;H01L21/285;H01L21/768;H01L29/45 主分类号 H01L21/28
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