发明名称 METHOD AND DEVICE FOR MEASURING INFORMATION IN VACUUM CHAMBER
摘要 PURPOSE:To measure information in a vacuum chamber simply and in time series and to transmit it to the outside of the vacuum chamber by transmitting data measured by a sensor in the vacuum chamber by radio. CONSTITUTION:A substrate 5 to be processed in the vacuum chamber 4 is set on a substrate holder 6 to be processed, and the sensor 3 which measures temperature, processing speed (film thickness, etc.), pressure, and a plasma parameter (floating potential), etc., that are the information is mounted on the substrate 5 to be processed. The information detected by the sensor 3 is converted to radio information by a transmitter connected to the sensor 3 by an electric cable 8 and a sensor information processor 1, and is sent to the outside of the vacuum chamber 4. A receiver and a sensor information processor 2 installed outside the vacuum chamber 4 receive the radio information sent from the transmitter and the sensor information processor 1, and the information detected by the sensor 3 can be obtained.
申请公布号 JPH0676193(A) 申请公布日期 1994.03.18
申请号 JP19930132150 申请日期 1993.06.02
申请人 SEIKO EPSON CORP 发明人 SOGA HARUAKI;MORI YOSHIAKI;HAYAKAWA MOTOMU
分类号 G01D21/00;G08C17/00;H01L21/302;H01L21/3065;(IPC1-7):G08C17/00 主分类号 G01D21/00
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