发明名称 Microcomputer IC card on wafer with test functions - has regions formed on wafer that provides debugging and test operations and can be broken off after use
摘要 The microcomputer IC card is produced with a CPU (2), a masked ROM (3), a RAM (4) for data storage, an input/output circuit (5) and an EEPROM for data storage. The units are interconnected by a bus (7). The masked ROM is used to store programme data. On either side of the main processing region there are other regions (130) that provide debugging functions or memory software development logic (140). Debugging connections (13) or data I/O ports (14) are provided. The IC card is produced as a semiconductor wafer with the debugging regions being separated along break lines (16) after testing. ADVANTAGE - Reduces cost of configuring and testing IC wafers.
申请公布号 DE4329335(A1) 申请公布日期 1994.03.10
申请号 DE19934329335 申请日期 1993.08.31
申请人 MITSUBISHI DENKI K.K., TOKIO/TOKYO, JP 发明人 MATSUBARA, TOSHIYUKI, ITAMI, HYOGO, JP
分类号 G06F15/78;G06K19/07;H01L21/66;(IPC1-7):H01L21/72;G06K19/077;G06F15/21;H01L23/50 主分类号 G06F15/78
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