发明名称 X-ray diffractometer.
摘要 The X-ray diffractometer is fitted with a spatially resolving detector (7) and a collimator (8) mounted upstream of the detector (7). Since the lamellae (9) of the collimator (8) are aligned radially with the sample (6) arranged at the centre of the measurement circle (10), only the X-radiation scattered on the sample (6) contributes to the measurement signal. Provided on the primary-beam side is an elliptically deformed multilayer mirror (2) which deflects the source radiation (4) without great loss of intensity in the direction of the sample (6) and focuses it at a point (16) on the measurement circle (10). Analysis of pulverulent samples which are enclosed in glass capillaries and are suitable for investigation in the abovenamed X-ray diffractometer. <IMAGE>
申请公布号 EP0585641(A1) 申请公布日期 1994.03.09
申请号 EP19930112514 申请日期 1993.08.04
申请人 SIEMENS AKTIENGESELLSCHAFT 发明人 GOEBEL, HERBERT, DR.
分类号 G01N23/207;G21K1/02;G21K1/06 主分类号 G01N23/207
代理机构 代理人
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