发明名称 |
Method and apparatus for generating test waveforms to be applied to a device under test |
摘要 |
A test waveform generator comprises a storage unit (1a , 1b) for storing timing information; a timing generator unit (2a, 2b) to which the timing information is input from the storage unit and which is adapted to output a timing pulse at a predetermined time on the basis of the timing information; and a waveform generating unit (3, 4) to which the pulse from the timing generator unit is input and which is adapted to output a test waveform. The timing generator unit is arranged so that the timing of the timing pulse is set with either (1) a period clock signal (CLK) serving as a reference or (2) another timing pulse serving as a reference.
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申请公布号 |
US5293080(A) |
申请公布日期 |
1994.03.08 |
申请号 |
US19920976683 |
申请日期 |
1992.11.16 |
申请人 |
HEWLETT-PACKARD COMPANY |
发明人 |
HIWADA, KIYOYASU;KASUGA, NOBUYUKI |
分类号 |
G01R31/319;G06F1/08;(IPC1-7):H03K4/00;H03K5/13;H03K7/00;H03K17/00 |
主分类号 |
G01R31/319 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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