发明名称 |
Field-effect transistor and method for fabricating the same. |
摘要 |
<p>There is disclosed a process for fabricating a field-effect transistor comprising: a first step of implanting ions in a semiconductor substrate (1) to form an active layer (3); a second step of forming a dummy gate on the semiconductor substrate (1), and implanting a dopant in the semiconductor substrate (1) with the dummy gate as a mask to form a first doped layer (6); a third step of reducing a conifiguration of the dummy gate, and implanting a dopant in the semiconductor substrate to form a second doped layer (7); a fourth step of forming an insulating film (8) using said reduced dummy gate; and a fifth step of removing a part of the insulating film on the first doped layer (6), forming an ohmic electrode (10; 11) in the region with the insulating film (8) removed, lifting off the insulating film using said reduced dummy gate, and forming a gate electrode (12) in the lifted-off region. <IMAGE></p> |
申请公布号 |
EP0581305(A2) |
申请公布日期 |
1994.02.02 |
申请号 |
EP19930112253 |
申请日期 |
1993.07.30 |
申请人 |
SUMITOMO ELECTRIC INDUSTRIES, LTD. |
发明人 |
NAKAJIMA, SHIGERU;MATSUZAKI, KEN-ICHIRO |
分类号 |
H01L21/302;H01L21/285;H01L21/3065;H01L21/338;H01L29/08;H01L29/812;(IPC1-7):H01L21/338;H01L21/28 |
主分类号 |
H01L21/302 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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