发明名称 Feldeffekttransistor in einem halbisolierenden Substrat hergestellt.
摘要 <p>Disclosed is a semiconductor device having a field effect transistor (FET) formed in a semi-insulative substrate (22). A positive bias voltage equal to or higher than the bias voltage applied to the drain electrode (27) of the FET is applied to a back surface electrode (29) formed on the back surface of the substrate (22), with the result that the electrons generated within the semi-insulative substrate (22) are pulled into the back surface electrode (29) so as to prevent said electrons from flowing into the drain region (24) and, thus, to prevent modulation of the drain current.</p>
申请公布号 DE3787069(T2) 申请公布日期 1994.01.05
申请号 DE19873787069T 申请日期 1987.06.15
申请人 KABUSHIKI KAISHA TOSHIBA, KAWASAKI, KANAGAWA, JP 发明人 INOUE, KAZUHIKO C/O PATENT DIVISION, MINATO-KU TOKYO 105, JP;TOMISAWA, YUTAKA C/O PATENT DIVISION, MINATO-KU TOKYO 105, JP
分类号 H01L23/12;H01L21/338;H01L27/02;H01L29/10;H01L29/812;(IPC1-7):H01L29/58;H01L29/80 主分类号 H01L23/12
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