发明名称 Non-volatile semiconductor memory, e.g. EPROM or EEPROM - has switch elements controlled by selection device each connecting external contact to memory cell array
摘要 The semiconductor memory has an external contact (4). A number of switch elements (QB0, QB1...QBn) each connect the external contact to a memory cell array (1a, 1b...1n). A bit row selection device (5) selects and turns on one of the switch elements. The selection device forms a current path, which runs from a determined memory cell (Qi) in the memory cell array of the same bit row to the external contact. When a voltage is applied to the external contact a current passes through the determined memory cell. ADVANTAGE - Enables direct measurement of electrical properties of memory cells and improvement of product yield and precision of product failure analysis.
申请公布号 DE4311120(A1) 申请公布日期 1994.01.05
申请号 DE19934311120 申请日期 1993.04.05
申请人 MITSUBISHI DENKI K.K., TOKIO/TOKYO, JP 发明人 SHIROTA, SHOZO, ITAMI, HYOGO, JP
分类号 G01R31/28;G11C17/00;G11C29/00;G11C29/12;G11C29/50;(IPC1-7):G11C29/00;G11C16/00;H01L27/115 主分类号 G01R31/28
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