发明名称 |
Non-volatile semiconductor memory, e.g. EPROM or EEPROM - has switch elements controlled by selection device each connecting external contact to memory cell array |
摘要 |
The semiconductor memory has an external contact (4). A number of switch elements (QB0, QB1...QBn) each connect the external contact to a memory cell array (1a, 1b...1n). A bit row selection device (5) selects and turns on one of the switch elements. The selection device forms a current path, which runs from a determined memory cell (Qi) in the memory cell array of the same bit row to the external contact. When a voltage is applied to the external contact a current passes through the determined memory cell. ADVANTAGE - Enables direct measurement of electrical properties of memory cells and improvement of product yield and precision of product failure analysis.
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申请公布号 |
DE4311120(A1) |
申请公布日期 |
1994.01.05 |
申请号 |
DE19934311120 |
申请日期 |
1993.04.05 |
申请人 |
MITSUBISHI DENKI K.K., TOKIO/TOKYO, JP |
发明人 |
SHIROTA, SHOZO, ITAMI, HYOGO, JP |
分类号 |
G01R31/28;G11C17/00;G11C29/00;G11C29/12;G11C29/50;(IPC1-7):G11C29/00;G11C16/00;H01L27/115 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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