Semiconductor integrated circuit device for burn-in test - has mode switch for applying input signal to semiconductor circuit during normal operation and applying fixed potential during testing

摘要

The semiconductor device includes an output terminal which receives an output signal from the semiconductor circuit during normal operation, and a power terminal applies a certain potential to the semiconductor circuit during normal operation. A mode switch is incorporated between the input terminal and the semiconductor circuit. The mode switch selects the circuit operation, i.e. testing or normal operation. The mode switch applies the input terminal signal, during normal operation, to the semiconductor circuit. A given fixed value is applied during testing. The mode switch receives a test signal, activated during testing, but deactivated during normal operation. USE/ADVANTAGE - For semiconductor device and wafer testing and burn-in, with burn-in facility for any encapsulation.