发明名称 SURFACE DEFECT INSPECTION DEVICE
摘要 PURPOSE:To inspect change in recessed and projecting parts of a coated object and that in color and then eliminate scattering by mounting a differential interference lens with a specific magnification in front of a CCD camera for capturing reflection light fro an object to be inspected. CONSTITUTION:For observing a surface defect of an object 7 to be inspected such as a magnetic drum and an optical disk a CCD camera 1 is mounted so that the distance to the surface of the object 7 to be inspected is maintained to be constant. A differential interference lens 2 with a magnification of 5-400 or a bright visual field lens 3 is mounted as needed. It is desirable that a mercury-xenon lamp 5 should be mounted to maintain the brightness of the object 7 to be inspected to be constant. Also, it is desirable that a dichroic mirror 4 should be mounted in front of the camera 1 to examine the change in color. A signal from the camera 1 is guided to an oscilloscope 6, thus judging presence or absence of defect. At this time, the width of a reference value is determined previously and those above or below the value are determined to be defective.
申请公布号 JPH05296941(A) 申请公布日期 1993.11.12
申请号 JP19920097851 申请日期 1992.04.17
申请人 DAINIPPON INK & CHEM INC 发明人 EBISAWA KATSUHIDE;OSHIMA KIYOSHI;UEHORI TATSUO
分类号 G01N21/88;G01B11/30;G01N21/93;G06T1/00 主分类号 G01N21/88
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