| 摘要 |
PURPOSE:To easily search for the fault of a device to be tested when an error is detected by applying a start-small test method which starts its operation at first with a combination of a small number of instructions and then gradually increases the subject instructions. CONSTITUTION:A tested device 1 is connected to an information processor 2 and consists of a test instruction train generating means 5 including a test execution pass time timer 3 and an instruction group number pointer 4, a test instruction train executing means 7 including a simulator 6, an error detecting means 8 to detect error, an error information output means 9 which outputs the detected error information to the outside, and a storage part 10 which stores the information on all test subject instructions. Then the device 1 divides all test subject instructions into (n) groups to add the group numbers into the information on these instructions and selects a test subject instruction among those instructions having the group numbers following the group number (i) shown by a pointer. Then '1' is added to the number of the number (i) stored in the pointer at each fixed time for generation of a new test instruction train. |
