发明名称 |
ELECTROSTATIC DISCHARGE CIRCUIT |
摘要 |
<p>PURPOSE: To protect a semiconductor integrated circuit against electrostatic discharge. CONSTITUTION: To shunt a surge voltage generated owing to electrostatic discharge a bipolar transistor(TR) 35 and a bipolar diode 36 are connected to an input pad 21 of the integrated circuit. They shunts an excessive current from an area which is easily damaged with a uniform current distribution that minimizes the damage. A diode clamp and a bipolar circuit 25 which has an optimum reverse bias yield voltage from a collector to a base are used. To improve immunity to the electrostatic discharge which is applied as a positive voltage to a source voltage VSS, reverse bias yield voltages of a diode and a transistor operating as a collector/base diode are reduced in areas 38 and 39 respectively. This circuit provides easy low-cost technology which achieves protection against electrostatic discharge in the most standard CMOS manufacture process without adding any other process.</p> |
申请公布号 |
JPH05183109(A) |
申请公布日期 |
1993.07.23 |
申请号 |
JP19920024280 |
申请日期 |
1992.01.16 |
申请人 |
MICRON TECHNOL INC |
发明人 |
TAIRAA EI ROURII;RANDARU DABURIYUU CHIYANSU |
分类号 |
G06F15/78;H01L21/822;H01L27/02;H01L27/04;H01L27/06;H01L29/78 |
主分类号 |
G06F15/78 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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