发明名称 Multi-dimensional sequential probability ratio test for detecting failure conditions in computer systems
摘要 One embodiment of the present invention provides a monitoring system that detects anomalies in data gathered from sensors in a computer system. During operation, the monitoring system samples data from a plurality of sensors located at various sampling points throughout the computer system. Next, the monitoring system interpolates the data from the sampling points to produce a real-time digitized surface. The monitoring system then subtracts a reference digitized surface from the real-time digitized surface to produce a residual digitized surface. Finally, the monitoring system applies a multi-dimensional sequential probability ratio test (SPRT) to the residual digitized surface to detect anomalies in the residual digitized surface which indicate an impending failure of the computer system.
申请公布号 US7191096(B1) 申请公布日期 2007.03.13
申请号 US20040918129 申请日期 2004.08.13
申请人 SUN MICROSYSTEMS, INC. 发明人 GROSS KENNY C.;URMANOV ALEKSEY M.
分类号 G06F11/30 主分类号 G06F11/30
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