| 摘要 |
PURPOSE:To provide a test pattern generating system enabling the judgment of comprehensive degree of a path activated by a generated test pattern. CONSTITUTION:A circuit dividing part 1 divides logical description 6 into each partial circuit and prepares divided logical description 7. A graph generating part 2 analyzes the divided logical description 7 and prepares graphic expression 8. A path selecting part 3 receives the graphic expression 8, selects a path to be activated and outputs selected path information 9. A pattern generating part 4 receives the graphic expression 8 and selected path information 9, and prepares a pattern 10 for activating the selected path. A comprehensive degree output part 5 receives the selected path information 9 and pattern 10, and outputs the comprehensive degree information 11 of the pattern for every divided partial circuit. |
