BURN-IN TEST DEVICE FOR SEMICONDUCTOR DEVICE,申请号JP19910240698-传众专利搜索

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发明名称	BURN-IN TEST DEVICE FOR SEMICONDUCTOR DEVICE
摘要
申请公布号	JPH0582615(A)	申请公布日期	1993.04.02
申请号	JP19910240698	申请日期	1991.09.20
申请人	NEC KYUSHU LTD	发明人	SANO YUICHI
分类号	G01R31/26;G01R31/28;H01L21/66	主分类号	G01R31/26
代理机构		代理人
主权项
地址

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