| 摘要 |
PURPOSE:To provide a diagnistic ratio evaluating method for a test pattern used in a serial scan circuit to be executed for acknowledging a failure sensible with the test pattern for testing the serial scan circuit, with which acknowledgement of failure can be done without performing failure simulation about all failure-assumed points. CONSTITUTION:After performing real value simulation in the first failure sensing process 11 in the condition a non-definitive valve is fed to a scan data-in pin of a serial scan circuit and the input condition value activating the path a failure pertaining to a scanning chain is sensed by back tracing the non- definitive value of the circuit from a scan data-out pin of the scanning chain to the corresponding scan data-in pin. After performing a real value simulation in the second failure sensing process 12 in the condition that a non-definitive value is fed to a scan lock pin in the serial scan circuit and the input condition value activating the path a failure pertaining to the scan lock is sensed by back tracing the non-definitive value on the scan lock. |
