发明名称 PRPARATION METHOD FOR DELAY TEST PATTERN
摘要 PURPOSE:To establish a pattern preparation method with high processing effi ciency for a theoretical circuit which has a number of internal circuits for the number of inputs by preparing a random input pattern to detect a delay trouble using simulation. CONSTITUTION:An initial value is applied to an FF 51 and an external input pin 52 to perform a simulation of a pre-stage combination circuit 53. Then, a transition signal of the FF 51 is determined using simulation results. An initial value of an FF 54 not presented in the FF 51. An initial value of an external input pin 55 not presented in the external input pin 52 and a transition value are determined. Here, a signal to be applied is determined so that more change signals appear, which provides a higher detection rate as compared with that when it is determined so that less change signals do. Then, a delay trouble simulation of a combination circuit 56 is performed using the initial value and the transition value of the external input pin 55 and the FF54 thereby removing troubles detected from a trouble list.
申请公布号 JPH0572287(A) 申请公布日期 1993.03.23
申请号 JP19910237808 申请日期 1991.09.18
申请人 HITACHI LTD 发明人 IKEDA KOJI;HIKONE KAZUFUMI;HATAKEYAMA KAZUMI;HAYASHI TERUMINE
分类号 G01R31/3183;G01R31/28;G06F11/22;G06F17/50;H03K19/00 主分类号 G01R31/3183
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