发明名称 Environmental stress screening device transfer apparatus
摘要 The disclosed shuttle apparatus provides for the transfer back and forth from compartment to compartment, electronic devices being environmentally stress tested in a multi-compartment environmental chamber of at least three compartments where the temperature in each adjacent compartment is of the opposite temperature extreme. The compact design of the environmental chamber makes it conductive to the small and medium size manufacturer for use in production assembly lines to eliminate latent defects in components and manufacturing processes contained in assemblies. The transfer is completed by activating a pneumatic cylinder to move the shuttle table. As each transfer is completed, doors affixed to the shuttle table form a seal with the door frame of each compartment thereby insulating each compartment's temperature from that of the other. The door and table assembly allows for the user to quickly load and unload electronic devices, subassemblies, and assemblies and/or their carriers. The door and table assembly can also be removed from the stress chamber by the user for reconfiguration to suit a greater variety of applications, thus, expanding the usefulness of the stress chamber and eliminate the need for additional specialized and costly equipment.
申请公布号 US5195384(A) 申请公布日期 1993.03.23
申请号 US19910646416 申请日期 1991.01.28
申请人 DUESLER, JR., IRA D.;HARNEY, JR., THOMAS P. 发明人 DUESLER, JR., IRA D.;HARNEY, JR., THOMAS P.
分类号 G01M99/00 主分类号 G01M99/00
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