发明名称 METHOD AND DEVICE FOR ELECTROSTATICALLY INVESTIGATING SURFACE AND SUB-SURFACE STRUCTURES
摘要 <p>An electrostatic sensing device for investigating a surface and/or sub-surface structure comprises a central and square electrically conductive sensor plate, and four side electrically conductive elongated and rectangular sensor plates connected together and each disposed adjacent and parallel to one edge of the central plae. The arrangement of sensor plates is applied to the surface, and the central and side plates are then electrically charged at different rates, the charging rate of the central plate being affected by the permittivity of the investigated structure to electric field. A differential amplifier (49) amplifies the difference between the voltages on the central and side plates as these plates charge, and a peak detector (61) detects the highest amplitude of this amplified voltage difference and displays it on a voltmeter (4). As the permittivity of the structure under investigation is function of at least one characteristic thereof, and as the voltage difference is affected by the charging rates of the central and side plates themselves affected by the permittivity to electric field, the output signal from the peak detector (61) is indicative of this characteristic of the inspected structure.</p>
申请公布号 WO1993003403(A1) 申请公布日期 1993.02.18
申请号 CA1991000270 申请日期 1991.08.01
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