| 摘要 |
An encryption key, required to encrypt and decrypt data according to a predefined algorithm is usually retained in a volatile memory device. Detection of loss of the key or corruption of the key is frequently possible only be means of the encryption circuit itself testing the key. Automated and repetitive testing of encryption keys by means of a processor or a control circuit periodically requesting the encryption circuit to test an encryption key minimizes data loss and system down time due to corrupted or lost keys. |
