发明名称 BIPOLAR RAM
摘要 PURPOSE:To perform a leakage test of a cell with ease by having a circuit which controls a holding current and a read current. CONSTITUTION:A holding current applied by wordtops WT 1-1-1-n flows to constant current sources 6-1-6-n for the holding current. The constant current sources 6-1-6-n are controlled in their current values by a controlling signal from a holding current controlling circuit 7. Digit lines DL2-1 and DR3-1 are connected to cells 4-11-4-n1, and also to a digit decoder 5-1. Digit lines DL2-2-2-m and DR3-2-3-m are also connected in the same way. Digit decoders DS5-1-5-m are connected to a constant current source 10 for a read current, and when the digit decoder selected by an address signal is logically turned on, a read current flows on the digit line connected to the selected digit decoder. The constant current source 10 is controlled in its current value by the control signal from a read current control circuit 8.
申请公布号 JPH0513530(A) 申请公布日期 1993.01.22
申请号 JP19910167950 申请日期 1991.07.09
申请人 NEC CORP 发明人 SHODA HIROAKI
分类号 G11C11/411;G11C29/00;G11C29/04;H01L21/66;H01L21/822;H01L21/8229;H01L27/04;H01L27/102 主分类号 G11C11/411
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