RANDOM ACCESS MEMORY TEST CIRCUIT,申请号JP19910183100-传众专利搜索

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发明名称	RANDOM ACCESS MEMORY TEST CIRCUIT
摘要
申请公布号	JPH056698(A)	申请公布日期	1993.01.14
申请号	JP19910183100	申请日期	1991.06.27
申请人	NEC CORP	发明人	USAMI MINORU
分类号	G01R31/28;G11C29/00;G11C29/02;G11C29/12;G11C29/56	主分类号	G01R31/28
代理机构		代理人
主权项
地址

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