发明名称 ULTRASONIC IMAGE INSPECTING APPARATUS
摘要 PURPOSE:To enable focus matching without requiring expert knowledge by adding a drive pulse group having a predetermined delay time pattern to an array probe to perform electronic scanning. CONSTITUTION:The echo level of a focus corresponding position from the object 3 to be inspected due to the scanning of an array probe 10 is detected and the measured image of a surface to be inspected is displayed using display data based on the measured value. At this time, a drive pulse group having a predetermined delay time pattern is added to the probe 10 in the direction along the surface to be inspected to perform the electronic scanning to the object 3 to be inspected. The delay time pattern of a memory 23 is selected so that the focus of ultrasonic beam electronically converged on the basis of the delay time pattern accompanied by the movement due to said scanning is successively changed in the depth direction of the object 3 to be inspected. A measured image is displayed on a display 27 on the basis of the measured value obtained by this scanning. When the signal wherein the part of this image is selected is inputted from the outside, the measured image of the object 3 to be inspected is obtained on the basis of the delay time pattern at the time of the collection of the measured value corresponding to said signal.
申请公布号 JPH04369474(A) 申请公布日期 1992.12.22
申请号 JP19910169273 申请日期 1991.06.14
申请人 HITACHI CONSTR MACH CO LTD 发明人 TAKISHITA YOSHIHIKO;ARIMA YUKIO
分类号 G01N29/06;A61B8/14;G01N29/22;G01N29/26 主分类号 G01N29/06
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