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发明名称
GATE ARRAY RAM BLOCK TEST CIRCUIT
摘要
申请公布号
JPH04344400(A)
申请公布日期
1992.11.30
申请号
JP19910146911
申请日期
1991.05.21
申请人
NEC CORP
发明人
TSUTSUI HIROAKI
分类号
G01R31/28;G11C29/00;G11C29/56;H01L21/82;H01L27/10;H01L27/118
主分类号
G01R31/28
代理机构
代理人
主权项
地址
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