SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE AND TESTING METHOD FOR CIRCUIT BLOCK,申请号JP19910108000-传众专利搜索

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发明名称	SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE AND TESTING METHOD FOR CIRCUIT BLOCK
摘要
申请公布号	JPH04337486(A)	申请公布日期	1992.11.25
申请号	JP19910108000	申请日期	1991.05.14
申请人	MITSUBISHI ELECTRIC CORP	发明人	MAENO HIDESHI
分类号	G01R31/28;H01L21/66;H01L21/822;H01L27/04	主分类号	G01R31/28
代理机构		代理人
主权项
地址

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