发明名称 Method for the thermal characterization, visualization, and integrity evaluation of conducting material samples or complex structures
摘要 A method for modeling a conducting material sample or structure (herein called a system) as at least two regions which comprise an electrical network of resistances, for measuring electric resistance between at least two selected pairs of external leads attached to the surface of the system, wherein at least one external lead is attached to the surface of each of the regions, and, using basic circuit theory, for translating measured resistances into temperatures or thermophysical properties in corresponding regions of the system.
申请公布号 US5165794(A) 申请公布日期 1992.11.24
申请号 US19910739376 申请日期 1991.08.02
申请人 THE UNITED STATES OF AMERICA AS REPRESENTED BY THE UNITED STATES DEPARTMENT OF ENERGY 发明人 ORTIZ, MARCOS G.
分类号 G01K1/02;G01N27/04 主分类号 G01K1/02
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