发明名称 ULTRASONIC MICROSCOPE HAVING INCLINATION CORRECTING FUNCTION
摘要 PURPOSE:To correct inclination of a sample easily and with a high accuracy by a method wherein one line each of scanning is performed in directions X and Y to calculate phase differences from the reflection signal and a reference position in the respective lines and inclinations of a scanning surface and a sample surface are obtained from the phase differences and directional positions to drive the sample surface for eliminating the inclination. CONSTITUTION:Oscillation continuous wave of a high frequency signal generator 9 is modulated to a burst wave with an RF switch 10 to be applied to a sample 2 through a circulator 11, an ultrasonic probe 1A and an ultrasonic lens 1 and the reflected wave thereof is ouputted to an amplifier 12 and a multiplier 15 through the probe 1A and the circulator 11. On the hand, the oscillation continuous wave is ouputted to the multiplier 15 as reference signal through a phase shifter 14 to be multiplied by a reflection signal. Then, a phase difference between the reflection signal and the reference signal is calculated with a processor 13 to determine inclination in the directions x and y from a relationship between the phase difference and a moving distance. Gonio stage drivers 5 and 6 are controlled automatically with respect to the inclination to correct the sample surface and the scanning surface parallel.
申请公布号 JPH04331367(A) 申请公布日期 1992.11.19
申请号 JP19910130506 申请日期 1991.05.02
申请人 HITACHI CONSTR MACH CO LTD 发明人 YAMAGUCHI SHOJI
分类号 G01N29/06 主分类号 G01N29/06
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