| 摘要 |
PURPOSE:To make one incorporating self-diagnosis unit diagnose a plurality of RAMs in one chip. CONSTITUTION:Address generating section 31 generates addresses a plurality of RAMs, and write data generating section 32 sends write data for a plurality of RAMs at a time. When test data is written for a plurality of RAMs, next via signal lines 301 and 302, data is read out of RAMs, and an expected value that generate expected value generating circuit 33 is compared with data that was read out of RAM using comparators 36 and 37. |
