发明名称 |
Testing electrical conductor arrangement, esp. on circuit board |
摘要 |
A method of testing an electrical conductor arrangement for short circuits and/or open circuits involves detecting measurement values at circuit test points and evaluating them. The conductor arrangement is subjected to an electrical field and an electrical potential measured at each measurement point using measurement probes. The measured potentials are compared with each other and/or with a reference potential. The electrical field can be produced using an electrode arrangement.
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申请公布号 |
DE4134193(A1) |
申请公布日期 |
1992.10.15 |
申请号 |
DE19914134193 |
申请日期 |
1991.10.16 |
申请人 |
ATG ELECTRONIC GMBH, 6980 WERTHEIM, DE |
发明人 |
VERZICHT DES ERFINDERS AUF NENNUNG |
分类号 |
G01R31/28 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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