发明名称 CHARGED PARTICLE EQUIPMENT
摘要 PURPOSE:To determine the actual orbit of an electron beam by installing a charged particle beam position monitor between the magnetic poles of at least one deflection electromagnet of deflection magnets arranged at the deriving part of synchrotron radiation. CONSTITUTION:An electron beam position monitor 6 is installed in a vacuum duct 2 arranged between the magnetic poles of a deflection electromagnet 3 arranged at the deriving part of synchrotron radiation. When electrons, which are circling in the duct 2, pass through near an electrode, charge is induced electrostatically at the electrode. The monitor 6 measures the induced charge amount as a voltage so as to monitor the position of the electron beam. Thereby the actual orbit of the electron beam can be determined, and it is possible to perform easily the position adjustment of the synchrotron radiation beam line 9 itself, or the adjustment of an optical system in the beam line 9.
申请公布号 JPH04289699(A) 申请公布日期 1992.10.14
申请号 JP19910055045 申请日期 1991.03.19
申请人 FUJITSU LTD 发明人 KIKUCHI TOMOKO
分类号 G01T1/29;H05H13/04 主分类号 G01T1/29
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