ALTERING CIRCUIT FOR PIN CONNECTION OF IC TESTER,申请号JP19910072521-传众专利搜索

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发明名称	ALTERING CIRCUIT FOR PIN CONNECTION OF IC TESTER
摘要
申请公布号	JPH04283671(A)	申请公布日期	1992.10.08
申请号	JP19910072521	申请日期	1991.03.12
申请人	ANDO ELECTRIC CO LTD	发明人	SHIMIZU AKIRA
分类号	G01R31/26	主分类号	G01R31/26
代理机构		代理人
主权项
地址

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