TESTING CIRCUIT OF SEMICONDUCTOR INTEGRATED CIRCUIT,申请号JP19910057990-传众专利搜索

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发明名称	TESTING CIRCUIT OF SEMICONDUCTOR INTEGRATED CIRCUIT
摘要
申请公布号	JPH04270976(A)	申请公布日期	1992.09.28
申请号	JP19910057990	申请日期	1991.02.27
申请人	NEC CORP	发明人	MIURA TADAHIKO
分类号	G01R31/28;H01L21/66	主分类号	G01R31/28
代理机构		代理人
主权项
地址

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