发明名称 Geometric arrangement for single gate multi-source and drain FET - comprises central insulated gate surrounded by concentric ring of individually isolated source and drain regions
摘要 The single gate, multi-source/drain field effect transistor comprises a highly-doped segmented toroidal (or square-plan) diffusion region (contg. at least three segments) set within a substrate of a second doping type and covered with an insulating oxide layer. Each segment (G1 to G8) is isolated (ISO) from adjoining segments and features an individual source (S1,S2) or drain (D1 to D5) contact formed from a metallic layer (K) inset into the oxide insulator. The central gate contact (GE) overlaps the inner edge of each segment (AD1,AD2,AS2) and completely covers the central channel region (KG). ADVANTAGE - Unique geometric arrangement allows size of source and drain areas and channel resistance to be defined in relation to one another.
申请公布号 DE4108818(A1) 申请公布日期 1992.09.24
申请号 DE19914108818 申请日期 1991.03.18
申请人 SIEMENS AG, 8000 MUENCHEN, DE 发明人 EICHFELD, HERBERT, DIPL.-ING. (UNIV.), 8000 MUENCHEN, DE
分类号 H01L29/06;H01L29/08;H01L29/10;H01L29/423 主分类号 H01L29/06
代理机构 代理人
主权项
地址