| 摘要 |
PURPOSE:To inspect a surface defect of a product on an on-line basis at a high speed without decreasing inspection accuracy nor an inspection visual field by fetching defect bit information, breadthwise position information o the product, and movement-directional position information on the product to a RAM from three gates every time a defect pulse is generated. CONSTITUTION:A line image perpendicular to the moving direction of the product is formed on a CCD line sensor 3, whose output signal is converted into a binary signal by an A/D converting circuit 4; and the binary signal is made into pulses and a gate signal consisting of bits which are many enough to include a permissible defect value is generated from the leading edge of the 1st pulse every time a defect pulse is generated, thereby opening the three gates 8, 9, and 10 at the same time. Then, the defect bit information from the 1st gate 8, breadthwise position information on the product, and movement- directional position information on the product from the 3rd gate 10 are fetched to the RAM 11 respectively and then processed by a microcomputer 17. |
