发明名称 Automatic circuit tester with separate instrument and scanner busses.
摘要 <p>An automatic circuit tester (10) employs a scanner (20) embodied in a group of interconnected scanner boards (46, 47) that provide switching by means of mechanical relays. The scanner boards plug simultaneously into respective instrument boards (44) and into a common scanner bus (50) separate from an instrument bus (38) that carries the signals that control the instruments on the instrument boards (44). The scanner bus provides a common pathway for signals to travel between instruments or system pins to which one scanner board is connected and those to which another is connected. It also provides scanner-control paths so that the instrument boards to which the scanner boards are connected to not need to provide such paths and thus do not need to be custom-designed for the particular tester in which they are used. &lt;IMAGE&gt;</p>
申请公布号 EP0500310(A1) 申请公布日期 1992.08.26
申请号 EP19920301303 申请日期 1992.02.18
申请人 GENRAD, INC. 发明人 SULLIVAN, ROBERT C.;SARGENT, BRIAN J.;PINCUS, ROBERT H.;PIETRANTONI, RUDY D.
分类号 G01R31/28;G01R31/319 主分类号 G01R31/28
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