ELLIPSOMETRIC IMMUNOASSAY SYSTEM AND METHOD INCLUDING A THIN FILM DETECTION DEVICE

摘要

A process for producing multilayer thin film elements (60) useful in a wide variety of optical detection and assay methods and systems is disclosed. Also the elements (60), made by the process, exhibit improved test surfaces whose multilayers include at least one light reflective layer or substrate (10), a barrier layer (20) attached thereto, and a reactive layer (50) thereover having a measurable coating thickness different from the interactive analyte of interest. The elements (60) find utility in numerous thin film assay systems including those involving chemical, immunological and optical and non-optical determinations and in particular in ellipsometric immunoassays.