发明名称 SEMICONDUCTOR DEVICE
摘要 PURPOSE:To prevent delay of a time due to temperature rise in a chip by providing a detecting means to detect the temperature, changing the number of stages of an inverter according to the temperature corresponding to this detecting means. CONSTITUTION:When the inside temperature of the chip is low, the potential of a point C is set lower than the potential of a point D. When the inside temperature of the chip is increased, the reverse leak current of the PN joint of a diode 1 is increased. A resistor 2 enlarges the resistance value together with the increase of the temperature. Therefore, when the potential of the point C is increased, it is made higher than the potential of the point D. A waveform shaping circuit 4 shapes the waveform of an output from a differential amplifier 3 and outputs A. When the temperature is high, the output A is H and when the temperature is low, the output A is L. When the output A is H, the signal of IN traces the path of an inverter 11 from a clocked inverter 8. When the A is L, the signal of OUT traces the path of a clocked inverter 7 inverter 10 clocked inverter 9 inverter 11, and the number of inverters can be changed.
申请公布号 JPH04192913(A) 申请公布日期 1992.07.13
申请号 JP19900326948 申请日期 1990.11.27
申请人 MITSUBISHI ELECTRIC CORP 发明人 IKEDA YUTAKA
分类号 H03K5/13;H03K5/133 主分类号 H03K5/13
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