发明名称 MANUFACTURE OF SEMICONDUCTOR MEMORY
摘要 PURPOSE:To stably easily form an uneven part on the surface of a conductive film which becomes a charge storage electrode by forming many recesses and protrusions on the surface of a deposited film which become the electrode, forming the conductive film on the deposited film formed with the recesses and the protrusions, and removing the deposited film. CONSTITUTION:Many small recesses and protrusions are formed on the surface of a baron silicate glass(BPSG) film 7 which become a film to be deposited. Then, an n<+> type second polycrystalline silicon film 8a to become a conductive film is deposited on the film 7 and a first polycrystalline silicon film 6a, and many recesses and protrusions are formed on the surface. Thereafter, the film 8a on the film 7 and the film 6a on a silicon nitride film 20 and the film 8a are removed, the film 7 is removed by etching, thereby forming a storage electrode 9a. Thus, a conductive film having many recesses and protrusions on the surface and easily increasing in its surface area can be formed.
申请公布号 JPH04192461(A) 申请公布日期 1992.07.10
申请号 JP19900324636 申请日期 1990.11.26
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 OGAWA HISASHI
分类号 H01L27/04;H01L21/306;H01L21/822;H01L21/8242;H01L27/10;H01L27/108 主分类号 H01L27/04
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