METHOD OF DETERMINATION OF PARAMETERS OF SEMICONDUCTING MATERIALS,申请号SU19904836667-传众专利搜索

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发明名称	METHOD OF DETERMINATION OF PARAMETERS OF SEMICONDUCTING MATERIALS
摘要
申请公布号	SU1746337(A1)	申请公布日期	1992.07.07
申请号	SU19904836667	申请日期	1990.02.27
申请人	SIDORIN VIKTOR V,SU;SIDORIN YURIJ V,SU;PORINSH VIESTURS M,SU;GRIGULIS YURIS K,SU	发明人	SIDORIN VIKTOR V,SU;SIDORIN YURIJ V,SU;PORINSH VIESTURS M,SU;GRIGULIS YURIS K,SU
分类号	G01R31/28;H01L21/66	主分类号	G01R31/28
代理机构		代理人
主权项
地址

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