发明名称 SURFACE STATE INSPECTION DEVICE
摘要 PURPOSE:To have accurate and certain inspection including chromatic unevenness free from projections/recesses by determining the adaptivity factor of the concentration histogram of the photographed image data to the normal distribution of that of many articles of acceptable goods, and presuming the content of unacceptable articles from the standard deviation of its frequency distribution. CONSTITUTION:A concentration histogram is determined for the image data photographed by a photographing device, and determination of the adaptivity factor is made corresponding to the difference between the concentration histogram at this time and the theoretical frequency conforming to the normal distribution having respective means of standard deviation and the mean of each concentration histogram which has been determined from many individual samples of acceptable goods. This calculative motion to determine the adaptivity factor is made each time image data is fed to obtain a number of adaptivity factors, and the standard deviation of its frequency distribution is determined and projected on the preset relationship between the standard deviation and the content of unacceptable articles to make presumption of the unacceptability content of the group of objects to be inspected, and thereupon uniformity of the surface state is examined. Thereby the surface state including chromatic unevenness, etc., free from projections/recesses is sensed with a sense near the human senses.
申请公布号 JPH04152253(A) 申请公布日期 1992.05.26
申请号 JP19900278289 申请日期 1990.10.16
申请人 SEKISUI CHEM CO LTD 发明人 SATO YOICHI
分类号 G01B11/30;G01N21/88;G01N21/93;G01N21/94;G06T1/00;H04N7/18 主分类号 G01B11/30
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