发明名称 REFERENCE MARK RECOGNITION DEVICE OF SUBSTRATE
摘要 PURPOSE:To correctly recognize an area of a reference mark by automatically changing a binary threshold level when a binary operation area of the reference mark of a substrate is out of tolerance. CONSTITUTION:A picture of a reference mark 12 picked up by a camera on a substrate 11 is given binary treatment on the threshold level set up by a control means to operate an area of the reference mark. Then, this operation area is compared with a range of a preset reference value, for instance, when the operation area of the reference mark 12 is off the range of the preset reference value, the threshold levels A to C may be automatically changed. Accordingly, an operation area can be set within the preset tolerance. Thereby, the area of the reference mark can be correctly recognized.
申请公布号 JPH04139898(A) 申请公布日期 1992.05.13
申请号 JP19900263345 申请日期 1990.10.01
申请人 TOSHIBA CORP 发明人 KATO TOSHIO;KAWAI ISAMU
分类号 H05K13/02 主分类号 H05K13/02
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