发明名称 PROCESS AND DEVICE FOR THE OPTICAL MEASUREMENT OF THE OUTLINES OF AN OPAQUE OBJECT
摘要 The invention relates to a process and device for the optical measurement of the outlines of an opaque object (10) in which the shadow cast by object on which one or more light sources (14) play is sensed by one or more opto-electronic CCD sensors (13, 23) and the outlines of the object are determined taking account of the distance of the object from the sensors and the degree of magnification of the optical imaging device. With stationary sensors (13, 23), the object (10) is rotated through a total angle of at least 180 DEG about an axis of rotation (27) located preferably vertically to a sensor plane and parallel to the internal outline of the object, whereby the outlines of the object (10) are determined from the angles of rotation and the appropriate shadow images preferably detected by the sensor(s) (13, 23) in the axial and/or radial direction to the axis of rotation.
申请公布号 WO9207234(A1) 申请公布日期 1992.04.30
申请号 WO1991EP01929 申请日期 1991.10.10
申请人 ITI-IDEE INGENIEURBUERO ZUR FOERDERUNG VON TECHNISCH 发明人 WECKENMANN, ALBERT;CZIRWITZKY, THOMAS
分类号 G01B11/24 主分类号 G01B11/24
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