发明名称 |
TECHNIQUES USEFUL IN FABRICATING SEMICONDUCTOR DEVICES HAVING SUBMICRON FEATURES |
摘要 |
TECHNIQUES USEFUL IN FABRICATING SEMICONDUCTOR DEVICES HAVING SUBMICRON FEATURES Submicron resolution in the fabrication of transistors is obtained by using sidewall techniques. The techniques described remove the sidewalls after an oxidation step and the openings so formed by the removal are used as a mask for subsequent substrate modification by either diffusion or ion implantation. |
申请公布号 |
CA1299770(C) |
申请公布日期 |
1992.04.28 |
申请号 |
CA19880580655 |
申请日期 |
1988.10.19 |
申请人 |
AMERICAN TELEPHONE AND TELEGRAPH COMPANY |
发明人 |
FEYGENSON, ANATOLY |
分类号 |
H01L29/73;H01L21/033;H01L21/331 |
主分类号 |
H01L29/73 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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