发明名称 HIGH-RESOLUTION VISION SYSTEM FOR PART INSPECTION
摘要 A high-resolution vision system for a detailed inspection of parts. A charge coupled device provides high-resolution in both an X and a Y axis. Data from the charge coupled device resulting from a standard part is stored in compact form. Compact data from a part being inspected is compared with the compact data from the standard part to determine if the tested part is good or not.
申请公布号 US5103304(A) 申请公布日期 1992.04.07
申请号 US19900583256 申请日期 1990.09.17
申请人 FMC CORPORATION 发明人 TURCHECK, JR., STANLEY P.;BAIRD, RANDY K.;MARTIN, JAMES P.
分类号 G01N21/88;G01B11/02;G01N21/93;G06T1/00;G06T7/60;H04N5/225;H04N7/18 主分类号 G01N21/88
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