| 摘要 |
A breakaway switch probe (40) comprises an outer barrel (42) a movable plunger (44) in one end portion of the barrel, a terminal projecting (46) from the other end of the barrel (42), and a breakaway clip (50) mounted to the barrel (42) and normally engaging a contact surface on the plunger (44) for retaining the plunger (44) in its at-rest position, substantially immovable in the barrel (42) and out of contact with a switch point on the terminal. The plunger (44) is normally retained in its at-rest position spaced from the switch point so that absence of contact between the plunger (44) and the switch point produces an electrical open-circuit condition in electrical test circuitry connected to the probe (40). An external test force of less than the present level applied to the plunger (44) in opposition to the resistance force of the breakaway clip (50) will not move the plunger (44) from its at-rest position, thereby retaining the open-circuit test indication. The breakaway clip (50) is movable away from its engagement with the contact surface of the plunger (44) when the external test force applied to it exceeds the threshold level, and the movement of the breakaway clip (5) away from the plunger contact surface releases the plunger (44) for travel in the barrel (42) towards and into contact with the switch point to produce a closed-circuit condition in the electrical test circuit connected to the switch probe (40). |
