Three=dimensional coordinate measurer for sample - uses projector with grating to project strip pattern for quantitative absolute measuring by means of moire technique
摘要
The projector (1) is provided with a projection grating (3) so that a strip pattern can be projected onto the test object (6). A camera registers the latter with the superimposed Moire pattern, a reference grating (4) extending in parallel with the projection grating in the observation path. A sliding arrangement is used to move and measure the shift path of a calibrating device w.r.t. the test object at right angles to the gratings' plane.A control and evaluating computer controls the sliding arrangement as well as registering and evaluating the measurement data. A CCD sensor and optics can be used for equalising the grating constants.
申请公布号
DE4011406(A1)
申请公布日期
1992.03.05
申请号
DE19904011406
申请日期
1990.04.09
申请人
STEINBICHLER, HANS, DR., 8201 NEUBEUERN, DE;DR. BREUCKMANN GMBH, 7758 MEERSBURG, DE